X-ray absorption spectroscopy studies of nickel oxide thin film electrodes for supercapacitors

Kyung Wan Nam, Won Sub Yoon, Kwang Bum Kim

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Nickel oxide films were synthesized by electrochemical precipitation of Ni(OH)2 followed by heat-treatment in air at various temperatures (200-600 °C). Their structure and electrochemical properties were studied by cyclic voltammetry, X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). XRD results showed that the nickel oxide obtained at 250 °C or above has a crystalline NiO structure. The specific capacitance of the oxide depends on the heat-treatment temperature, showing a maximum value at 300 °C. XAS results revealed that the non-stoichiometric nickel oxide (Ni1-xO) approached the stoichiometric NiO structure with increasing heat-treatment temperature due to the defect healing effect. The defective nature of the nickel oxide could be utilized to improve its specific capacitance for supercapacitor application.

Original languageEnglish
Pages (from-to)3201-3209
Number of pages9
JournalElectrochimica Acta
Issue number19
Publication statusPublished - 2002 Jul 27


All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Electrochemistry

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