XPDF-ATPG: An efficient test pattern generation for crosstalk-induced faults

Sunghoon Chun, Yongjoon Kim, Taejin Kim, Myung Hoon Yang, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, we propose a new test generation method for delay faults considering crosstalk-induced delay effects, based on a conventional delay ATPG technique in order to reduce the complexity of previous ATPG algorithm for crosstalk delay faults and to consider multiple aggressor crosstalk faults to maximize the noise of the victim line. Since the proposed ATPG for crosstalk-induced delay faults uses the physical and timing information, the proposed ATPG can reduce the search space of the backward implication of the aggressor's constraints and it is helpful for reducing the time cost of the ATPG than previous works. In addition, since the proposed technique targets on the critical path for the original delay test as the victim lines, it can improve test effectiveness of delay testing. Experimental results demonstrate the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings of the 17th Asian Test Symposium, ATS 2008
Pages83-88
Number of pages6
DOIs
Publication statusPublished - 2008
Event17th Asian Test Symposium, ATS 2008 - Sapporo, Japan
Duration: 2008 Nov 242008 Nov 27

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other17th Asian Test Symposium, ATS 2008
CountryJapan
CitySapporo
Period08/11/2408/11/27

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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